Metrological support of satellite-borne UV-spectrometry using a backscattering technique

dc.contributor.author	Vashchenko, V.
dc.contributor.author	Patlashenko, Zh.
dc.contributor.author	Chernysh, E.
dc.date.accessioned	2017-05-28T18:33:12Z
dc.date.available	2017-05-28T18:33:12Z
dc.date.issued	2004
dc.description.abstract	Methods and physicotechnical facilities for examination, calibration and metrological testing of the main power spectral characteristics (total spectral sensitivity, scattered stray radiation, dynamic range) of the vehicle-borne ozone UV spectrometers in the spectral range 250-350 nm are considered.	uk_UA
dc.identifier.citation	Metrological support of satellite-borne UV-spectrometry using a backscattering technique / V. Vashchenko, Zh. Patlashenko, E. Chernysh // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 1. — С. 105-107. — Бібліогр.: 10 назв. — англ.	uk_UA
dc.identifier.issn	1560-8034
dc.identifier.other	PACS: 07.60.Rd
dc.identifier.uri	https://nasplib.isofts.kiev.ua/handle/123456789/118144
dc.language.iso	en	uk_UA
dc.publisher	Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України	uk_UA
dc.relation.ispartof	Semiconductor Physics Quantum Electronics & Optoelectronics
dc.status	published earlier	uk_UA
dc.title	Metrological support of satellite-borne UV-spectrometry using a backscattering technique	uk_UA
dc.type	Article	uk_UA

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