Some physical properties of Si₁₋xGex solid solutions using pseudo-alloy atom model

dc.contributor.authorJivani, A.R.
dc.contributor.authorTrivedi, H.J.
dc.contributor.authorGajjar, P.N.
dc.contributor.authorJani, A.R.
dc.date.accessioned2017-06-14T16:07:52Z
dc.date.available2017-06-14T16:07:52Z
dc.date.issued2005
dc.description.abstractSome electronic, thermodynamical and mechanical properties of Si1-xGex solid solution with an arbitrary (atomic) concentration (x) are studied using the pseudo-alloy atom model. This work is based on the pseudopotential theory of covalent crystals and on the higher-order perturbation scheme with the application of our proposed model potential. We have used the latest local field correction function proposed by Sarkar et al. alongwith other four local-field correction functions of Hartree, Taylor, Utsumi et al. and Farid et al. to study Si-Ge system. The total energy of the Si1-xGex solid solutions is investigated and compared with available experimental data. The calculated numerical values of the heat of solution for Si-Ge system are small and positive. The positive sign of the heat of solution predicts that, at low temperatures, the phase mixture will be more stable than the disordered solid solution. Like the case of simple metals, it is seen that a graph of the ratio of the heat of formations and x(1−x) against x is linear. The bulk modulus of Si1-xGex is also investigated with different concentrations x of Ge. We have found in the present study that the bulk modulus decreases linearly with an increase in the concentration x.uk_UA
dc.description.sponsorshipWe acknowledge the financial support of University Grand Commission, New Delhi.uk_UA
dc.identifier.citationSome physical properties of Si₁₋xGex solid solutions using pseudo-alloy atom model / A.R. Jivani, H.J. Trivedi, P.N. Gajjar, A.R. Jani // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 4. — С. 14-17. — Бібліогр.: 21 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS 62.20.Dc, 71.15.Dx, 71.15H, 71.25T, 71.45N
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/121544
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleSome physical properties of Si₁₋xGex solid solutions using pseudo-alloy atom modeluk_UA
dc.typeArticleuk_UA

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