Zero bias terahertz and subterahertz detector operating at room temperature
| dc.contributor.author | Momot, N. | |
| dc.contributor.author | Zabudsky, V. | |
| dc.contributor.author | Tsybrii, Z. | |
| dc.contributor.author | Apats’ka, M. | |
| dc.contributor.author | Smoliy, M. | |
| dc.contributor.author | Dmytruk, N. | |
| dc.date.accessioned | 2017-05-29T13:15:32Z | |
| dc.date.available | 2017-05-29T13:15:32Z | |
| dc.date.issued | 2010 | |
| dc.description.abstract | In this paper, the experimental study of the terahertz and subterahertz hot electron bolometer based on narrow-gap semiconductor compound Hg₁₋xCdxTe is presented. The measurements were performed in the temperature range from 77 to 300 K at various operating mode and frequency. The estimated value of the noise equivalent power at room temperature for detector proposed was 1.3·10⁻⁸ W/Hz¹/² and 5.4·10⁻⁹ W/Hz¹/² at bias current I = 1 mA and I = 0, respectively. | uk_UA |
| dc.identifier.citation | Zero bias terahertz and subterahertz detector operating/ N. Momot, V. Zabudsky, Z. Tsybrii, M. Apats'ka, M. Smoliy, N. Dmytruk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 2. — С. 166-169. — Бібліогр.: 11 назв. — англ. at room temperature | uk_UA |
| dc.identifier.issn | 1560-8034 | |
| dc.identifier.other | PACS 07.57.Kp, 72.20.Ht | |
| dc.identifier.uri | https://nasplib.isofts.kiev.ua/handle/123456789/118225 | |
| dc.language.iso | en | uk_UA |
| dc.publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України | uk_UA |
| dc.relation.ispartof | Semiconductor Physics Quantum Electronics & Optoelectronics | |
| dc.status | published earlier | uk_UA |
| dc.title | Zero bias terahertz and subterahertz detector operating at room temperature | uk_UA |
| dc.type | Article | uk_UA |
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