Influence of low-temperature annealing on the state of CdTe surface
dc.contributor.author | Parfenyuk, O.A. | |
dc.contributor.author | Ilashchuk, M.I. | |
dc.contributor.author | Chupyra, S.M. | |
dc.contributor.author | Burachek, V.R. | |
dc.contributor.author | Korbutyak, D.V. | |
dc.contributor.author | Krylyuk, S.G. | |
dc.contributor.author | Vakhnyak, N.D. | |
dc.date.accessioned | 2017-06-13T11:11:40Z | |
dc.date.available | 2017-06-13T11:11:40Z | |
dc.date.issued | 2005 | |
dc.description.abstract | Influence of low-temperature annealing on electrical and luminescent properties of semi-insulating n-CdTe:Sn is studied. It is shown that annealing at T ≥ 453 K modifies a near-surface layer of the crystals and this enhances the hole component of the conductivity. It is explained by Cd evaporation and subsequent enrichment of the near-surface layer with cadmium vacancies. Results of electrical measurements are confirmed by our low-temperature photoluminescence experiments. | uk_UA |
dc.identifier.citation | Influence of low-temperature annealing on the state of CdTe surface / O.A. Parfenyuk, M.I. Ilashchuk, S.M. Chupyra, V.R. Burachek, D.V. Korbutyak, S.G. Krylyuk, N.D. Vakhnyak // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 3. — С. 50-53. — Бібліогр.: 17 назв. — англ. | uk_UA |
dc.identifier.issn | 1560-8034 | |
dc.identifier.other | PACS: 72.80.Ey, 78.55.Et, 81.40.Rs, 81.40T | |
dc.identifier.uri | https://nasplib.isofts.kiev.ua/handle/123456789/120961 | |
dc.language.iso | en | uk_UA |
dc.publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України | uk_UA |
dc.relation.ispartof | Semiconductor Physics Quantum Electronics & Optoelectronics | |
dc.status | published earlier | uk_UA |
dc.title | Influence of low-temperature annealing on the state of CdTe surface | uk_UA |
dc.type | Article | uk_UA |
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