High-stable standard samples of mass in the nano-gram range

dc.contributor.authorMikhailov, I.F.
dc.contributor.authorBaturin, A.A.
dc.contributor.authorBugaev, Ye.A.
dc.contributor.authorMikhailov, A.I.
dc.contributor.authorBorisova, S.S.
dc.date.accessioned2017-06-11T05:46:35Z
dc.date.available2017-06-11T05:46:35Z
dc.date.issued2013
dc.description.abstractHigh-stable mass standards prepared as magnetron sputtered super-smooth metal layers deposited on single crystal substrates were attested. The thin film standards were found to meet the requirements to government standards: they are homogeneous, long-lived, and can be attested by several independent methods. Using the standards, the measurement accuracy is provided not worse than 1 ng in the range from 1 to 17 ng, and not worse than 8 ng in the range from 17 to 3800 ng.uk_UA
dc.identifier.citationHigh-stable standard samples of mass in the nano-gram range / I.F. Mikhailov, A.A. Baturin, Ye.A. Bugaev, A.I. Mikhailov, S.S. Borisova // Functional Materials. — 2013. — Т. 20, № 2. — С. 266-271. — Бібліогр.: 9 назв. — англ.uk_UA
dc.identifier.issn1027-5495
dc.identifier.otherDOI: dx.doi.org/10.15407/fm20.02.266
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/120075
dc.language.isoenuk_UA
dc.publisherНТК «Інститут монокристалів» НАН Україниuk_UA
dc.relation.ispartofFunctional Materials
dc.statuspublished earlieruk_UA
dc.subjectDevices and instrumentsuk_UA
dc.titleHigh-stable standard samples of mass in the nano-gram rangeuk_UA
dc.typeArticleuk_UA

Файли

Оригінальний контейнер

Зараз показуємо 1 - 1 з 1
Завантаження...
Ескіз
Назва:
23-Mikhailov.pdf
Розмір:
331.32 KB
Формат:
Adobe Portable Document Format
Опис:
Стаття

Контейнер ліцензії

Зараз показуємо 1 - 1 з 1
Завантаження...
Ескіз
Назва:
license.txt
Розмір:
817 B
Формат:
Item-specific license agreed upon to submission
Опис: