High-stable standard samples of mass in the nano-gram range
dc.contributor.author | Mikhailov, I.F. | |
dc.contributor.author | Baturin, A.A. | |
dc.contributor.author | Bugaev, Ye.A. | |
dc.contributor.author | Mikhailov, A.I. | |
dc.contributor.author | Borisova, S.S. | |
dc.date.accessioned | 2017-06-11T05:46:35Z | |
dc.date.available | 2017-06-11T05:46:35Z | |
dc.date.issued | 2013 | |
dc.description.abstract | High-stable mass standards prepared as magnetron sputtered super-smooth metal layers deposited on single crystal substrates were attested. The thin film standards were found to meet the requirements to government standards: they are homogeneous, long-lived, and can be attested by several independent methods. Using the standards, the measurement accuracy is provided not worse than 1 ng in the range from 1 to 17 ng, and not worse than 8 ng in the range from 17 to 3800 ng. | uk_UA |
dc.identifier.citation | High-stable standard samples of mass in the nano-gram range / I.F. Mikhailov, A.A. Baturin, Ye.A. Bugaev, A.I. Mikhailov, S.S. Borisova // Functional Materials. — 2013. — Т. 20, № 2. — С. 266-271. — Бібліогр.: 9 назв. — англ. | uk_UA |
dc.identifier.issn | 1027-5495 | |
dc.identifier.other | DOI: dx.doi.org/10.15407/fm20.02.266 | |
dc.identifier.uri | https://nasplib.isofts.kiev.ua/handle/123456789/120075 | |
dc.language.iso | en | uk_UA |
dc.publisher | НТК «Інститут монокристалів» НАН України | uk_UA |
dc.relation.ispartof | Functional Materials | |
dc.status | published earlier | uk_UA |
dc.subject | Devices and instruments | uk_UA |
dc.title | High-stable standard samples of mass in the nano-gram range | uk_UA |
dc.type | Article | uk_UA |
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