Semicond. Physics Quantum Electronics & Optoelectronics, 2009, № 2

ЗМІСТ

Indutnyi I.Z.,Michailovska K.V., Min'ko V.I., Shepeliavyi P.E.
Effect of acetone vapor treatment on photoluminescence of porous nc-SiSiO_x nanostructures

Smyntyna V.A., Sviridova O.V.
Influence of initial defects on defect formation process in ion doped silicon

Morozovska A.N., Svechnikov G.S., Shishkin E.I., Shur V.Y.
Domain structure formation by using Scanning Probe Microscopy: equilibrium polarization distribution and effective piezoelectric response calculations

Denysyuk R.O., Tomashik V.M., Tomashik Z.F., Chernyuk O.S., Grytsiv V.I.
Chemical treatment of monocrystalline cadmium telluride and Cd_1-xMn_xTe solid solutions by Н₂О₂-НІ-citric acid etchant compositions

Maksimenko L.S., Matyash I.E., Rudenko S.P., Serdega B.K.
The features of surface plasmon resonance in gold cluster films

Hasanov H.A.
Electrophysical properties of Sm_xPb_1-xTe solid solutions

Halyan V.V., Shevchuk M.V., Davydyuk G.Ye., Voronyuk S.V., Kevshyn A.H., Bulatetsky V.V.
Glass formation region and X-ray analysis of the glassy alloys in AgGaSe₂+GeS₂↔AgGaS₂+GeSe₂ system

Makhniy V.P., Skrypnyk N.V., Boyko Yu.N.
Perspective of surface modification of CdTe single crystal substrate for creation photosensitive barrier structures

Kulish M.R., Malish N.I.
Properties of phase-shifting devices, intended for research of nonlinear absorption

Boichuk V.I., Bilynskyi I.V., Leshko R.Ya.
Hydrogenic impurity in a two-layer spherical quantum dot

Donets V.V., Melnichenko L.Y., Shaykevich I.A., Lomakina O.V.
Determination of refractive index dispersion and thickness of thin antireflection films TiO₂ and Si₃N₄ on siliceous photoelectric transducers surface in transducer production process

Kaganovich E.B., Kizyak I.M., Kudryavtsev A.A., Manoilov E.G.
Photoluminescent properties of Al₂O₃ films containing gold nanoparticles

Bilyy O.I., Yaremyk R.Y., Kostyukevych S.O., Kostyukevych K.V.
Adaptive cross-correlation detector for signals optoelectronic reflective sensors

Vlaskin V., Vlaskina S., Berezhinsky L., Svechnikov G.
Reliability of AC thick-film electroluminescent lamps

Bourdoucen H., Zitouni A.
Data acquisition, parameter extraction and characterization of active components using integrated instrumentation system

Kulish M.R., Lisitsa M.P., Malysh N.I.
Influence of two-photon absorption on polarization of light traveling in uniaxial crystals [Стаття відсутня]

Savenkov S.N., Oberemok Ye.A., Yakubchak V.V., Barchuk О.I.
Matrix model of inhomogeneous medium with circular birefringence in single scattering case